Kyoto, Japan

Teruhisa Yotsuya


Average Co-Inventor Count = 2.3

ph-index = 6

Forward Citations = 195(Granted Patents)


Company Filing History:


Years Active: 1990-2011

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11 patents (USPTO):Explore Patents

Title: Teruhisa Yotsuya: Innovator in Substrate Inspection Technologies

Introduction

Teruhisa Yotsuya is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of substrate inspection technologies, holding a total of 11 patents. His work focuses on improving the processes involved in soldering and component mounting, which are critical in electronics manufacturing.

Latest Patents

Yotsuya's latest patents include methods and apparatus for inspecting substrates during various stages of production. One notable invention involves an inspection apparatus that captures images of a substrate before and after the soldering process. This technology allows for the identification of components through differentiation and binarization processes. By setting conditions for inspection windows based on identified components, the apparatus can effectively analyze the substrate's condition using image data and standard inspection data.

Another significant patent describes an image processing method that extracts target objects from color images. This method involves comparing color data from images containing target objects to reference images without them. By analyzing the differences in intensity of color data, the system can recognize and extract pixels that meet specific criteria, thereby identifying the target object.

Career Highlights

Throughout his career, Teruhisa Yotsuya has worked with notable companies such as Omron Corporation and Omron Tateisi Electronics Co. His experience in these organizations has allowed him to develop and refine his innovative technologies in substrate inspection.

Collaborations

Yotsuya has collaborated with several professionals in his field, including Kiyoshi Murakami and Masato Ishiba. These collaborations have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Teruhisa Yotsuya's contributions to substrate inspection technologies have significantly impacted the electronics manufacturing industry. His innovative methods and apparatus continue to enhance the efficiency and accuracy of production processes.

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