The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Jan. 08, 2003
Yoshiki Fujii, Kyoto, JP;
Kiyoshi Murakami, Fukuchiyama, JP;
Yoshiki Fujii, Kyoto, JP;
Kiyoshi Murakami, Fukuchiyama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
In a substrate inspecting apparatus comprising a projecting section () in which light sources (), () and () are provided for emitting colored lights of R, G and B in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (), () and () are converted into monochromatic shaded images by the extraction processing. A boundary position between the inclined surfaces adapted to the light sources () and () are converted into one shaded image having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources () and () is converted into a different shaded image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile