This inventor holds 4 USPTO granted patents. Top assignee: Ando Electric Company. Active years: 2003-2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo, JP (2003 - 2004)
- Kanagawa, JP (2004)
- Hamamatsu, JP (2005)
Company Filing History:
Years Active: 2003-2005
Title: Kiyohisa Fujita: Innovator in Wavelength Measurement Technologies
Introduction
Kiyohisa Fujita is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of optical measurement technologies. With a total of 4 patents to his name, Fujita's work focuses on enhancing the accuracy and efficiency of wavelength-dependent measurement systems.
Latest Patents
Fujita's latest patents include a "Wavelength Dependence Measuring System" and a "Polarization Dependent Loss Measuring Apparatus." The wavelength dependence measuring system features a tunable laser source that outputs light to a device under test (DUT) while continuously varying the wavelength. This system ensures accurate measurements by utilizing optical power meters and a wavelength measuring unit. The arithmetic operation unit processes the outputs to provide a light intensity value relative to each wavelength.
The polarization dependent loss measuring apparatus allows for wavelength-dependent measurements by launching light into an object and receiving transmitted light while changing the output light's wavelengths. This system detects peak wavelengths and measures polarization-dependent loss by analyzing the transmitted light while varying the polarization state of the light.
Career Highlights
Fujita is currently employed at Ando Electric Company, where he continues to innovate in the field of optical technologies. His work has been instrumental in advancing measurement systems that are crucial for various applications in telecommunications and optical engineering.
Collaborations
Fujita collaborates with Nobuaki Ema, a fellow innovator in the field. Their partnership has led to the development of advanced measurement technologies that enhance the capabilities of optical systems.
Conclusion
Kiyohisa Fujita's contributions to wavelength measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of optical systems and their applications. Fujita's work continues to influence the field, paving the way for future advancements in optical measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile