The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Jun. 06, 2001
Applicant:
Inventor:
Kiyohisa Fujita, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/900 ; G01R 2/300 ;
U.S. Cl.
CPC ...
G01R 1/900 ; G01R 2/300 ;
Abstract
Techniques for use in sweep synchronization test equipment include receiving a simulation setting and displaying a simulated result based on the simulation setting and previously-measured data. The equipment is switched to a measurement mode in response to user activity, and the simulation setting is used as a control setting. A new measurement is performed based on the control setting. The displayed simulated result is updated based on data obtained from the new measurement.
Quick Actions:
Fujita, Kiyohisa. (2003). Sweep synchronization testing (U.S. Patent No. 6646428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6646428
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile