The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Jun. 29, 2001
Kiyohisa Fujita, Kanagawa, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
Optical wavelength sensitivities in an optical meter used for a sweep synchronization measurement are corrected by a method comprising the steps of measuring a plurality of reference values when no device under test is connected to the optical meter, computing a series of corrective values for the reference values for a plurality of selected reference wavelengths, respectively, such that the reference value at one of the selected reference wavelengths is zero, correcting a plurality of actual measured values using the series of corrective values when an device under test is connected to the optical meter, and displaying the actual measured values corrected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile