Ando Electric Company

Kiyohisa Fujita

Nobuaki Ema

A swept-wavelength loss measuring system is provided with an arrangement including a tunable laser source that outputs light to a DUT with the wavelength being continuously varied, and outputs measuring trigger signals at arbitrary intervals, at least one optical power meter for measuring an intensity of light transmitted through the DUT in response to reception of each of the measuring trigger signals, a wavelength measuring unit for measuring a wavelength of the outputted light from the tunable laser source in response to reception of each of the measuring trigger signals, and an arithmetic operation unit carrying out an arithmetic operation of the outputs from the optical power meter and the wavelength measuring unit to output a light intensity value relative to each wavelength. The arrangement assures accuracy of the measured wavelength.

Wavelength dependence measuring system

Wavelength dependent measurement is made by launching light into an object to be measured and receiving transmitted light from the object while continuously changing wavelengths of output light. Next, peak wavelength detection processing for detecting a wavelength at the time when loss or gain of the transmitted light from the object becomes maximum based on a wavelength dependent measurement result is performed. Then, polarization dependent loss measurement processing for measuring polarization dependent loss of the object is performed by measuring the transmitted light from the object while launching light of a measurement wavelength detected into the object and randomly changing a polarization state of the light. Further, a control circuit processes associating a wavelength dependent analysis result with a PDL measurement result, and displays its result on a display part

Polarization dependent loss measuring apparatus

Optical wavelength sensitivities in an optical meter used for a sweep synchronization measurement are corrected by a method comprising the steps of measuring a plurality of reference values when no device under test is connected to the optical meter, computing a series of corrective values for the reference values for a plurality of selected reference wavelengths, respectively, such that the reference value at one of the selected reference wavelengths is zero, correcting a plurality of actual measured values using the series of corrective values when an device under test is connected to the optical meter, and displaying the actual measured values corrected.

Apparatus for sweep synchronization measurement of optical wavelength sensitivity characteristics and method of correcting optical wavelength sensitivity thereof

Techniques for use in sweep synchronization test equipment include receiving a simulation setting and displaying a simulated result based on the simulation setting and previously-measured data. The equipment is switched to a measurement mode in response to user activity, and the simulation setting is used as a control setting. A new measurement is performed based on the control setting. The displayed simulated result is updated based on data obtained from the new measurement.

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Tokyo, Japan

Kiyohisa Fujita