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For the Inventor, By the Inventor

Hitachiota, Japan

Kishio Hidaka

This inventor holds 31 USPTO granted patents and 3 published patent applications, primarily in Scanning Probe Microscopy. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hiatchi, Ltd.. Active years: 1996-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kishio Hidaka. Retrieved from https://idiyas.com/inventor/kishio-hidaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 31 

% Patents Active = 48.4

Average Co-Inventor Count = 5.4

ph-index = 10

Forward Citations = 315(Granted Patents)


Location History:

  • Hitachiohta, JP (2003 - 2006)
  • Tsuchiura, JP (2008)
  • Hitahiota, JP (2010)
  • Hitachioota, JP (1999 - 2013)
  • Hitachi, JP (1996 - 2014)
  • Hitachiota, JP (1999 - 2014)

Company Filing History:

goldMedal25 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal3 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal1 out of 17 
 
Hiatchi, Ltd.
 patents
4. 1 out of 9 
 
Hitachi Instruments Engineering Co., Ltd.
 patents
5. 1 out of 7 
 
Hitachi Kenki Fine Tech Co., Ltd.
 patents
6. 1 out of 1 
 
The Japane Steel Works, Ltd.
 patent
7. 1 out of 834,453 
Other
 patents
where one patent can have more than one assignee

Years Active: 1996-2014

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Areas of Expertise:
Scanning Probe Microscope
Field Emission Electron Gun
Electromagnetic Wave Absorption
Carbon Nanotube
Catalytic Material
Gas Turbine
Electron Microscope
High Strength Steel
Sample Observing Method
Probe Manufacturing
Charged Particle Beam
Power Generation
31 patents (USPTO):Explore Patents
1. 8695110 - Scanning probe microscope and sample observing method using the same (2014-04-08),
2. 8635710 - Scanning probe microscope and method of observing sample using the same (2014-01-21),
3. 8407811 - Scanning probe microscope and method of observing sample using the same (2013-03-26),
4. 8272068 - Scanning probe microscope and sample observing method using the same (2012-09-18),
5. 8181268 - Scanning probe microscope and method of observing sample using the same (2012-05-15),
6. 7777404 - Field emission type electron gun comprising single fibrous carbon electron emitter and operating method for the same (2010-08-17),
7. 7732764 - Field emission electron gun and electron beam applied device using the same (2010-06-08),
8. 7710012 - Conductive probe and method for producing the same (2010-05-04),
9. 7388199 - Probe manufacturing method, probe, and scanning probe microscope (2008-06-17),
10. 7239261 - Electromagnetic wave absorption material and an associated device (2007-07-03),
11. 7151268 - Field emission gun and electron beam instruments (2006-12-19),
12. 7109703 - Magnetic carbon nanotube (2006-09-19),
13. 7108939 - Covalently bonded catalyst carrier and catalytic component (2006-09-19),
14. 7105246 - Catalytic material, electrode, and fuel cell using the same (2006-09-12),
15. 6991932 - Carbon nanotube connected instrument (2006-01-31),

Title: **Kishio Hidaka: A Pioneer in Scanning Probe Microscopy**

Introduction

Kishio Hidaka, an innovative inventor hailing from Hitachiota, Japan, has made significant contributions to the field of microscopy with an impressive portfolio of 31 patents. His work primarily focuses on enhancing the capabilities of scanning probe microscopes, which are essential tools in the field of nanotechnology.

Latest Patents

Hidaka's latest patents include groundbreaking advancements in scanning probe microscopy and sample observing methods. His developments address key limitations in traditional near-field scanning microscopes that often struggle with issues of resolution and measurement reproducibility. By fabricating a plasmon-enhanced near-field probe that combines a nanometer-order cylindrical structure with nanometer-order microparticles, he enables measurements of optical data and surface unevenness at unprecedented resolution. This innovative approach minimizes damage to both the probe and the sample, allowing for high-quality data acquisition.

Career Highlights

Kishio Hidaka has built his career working with notable companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His tenure at these organizations has been marked by a relentless pursuit of excellence in scientific research and development. His inventions have helped propel the practical applications of microscopy technology into new realms, benefiting various industries and scientific fields.

Collaborations

Throughout his career, Hidaka has collaborated with esteemed colleagues including Mitsuo Hayashibara and Tadashi Fujieda. These collaborations have fostered an environment of innovation that has led to the advancement of key technologies in microscopy. Together, they have pushed the boundaries of what is possible in scientific observations at the nanoscale.

Conclusion

Kishio Hidaka's contributions to scanning probe microscopy underscore the importance of innovation in scientific discovery and technological advancement. With his extensive background, numerous patents, and collaborative efforts, he continues to influence the field profoundly, paving the way for future advancements in microscopy and beyond. His work exemplifies how dedicated inventors can shape the landscape of modern science with ingenuity and precision.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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