Hitachiota, Japan

Kishio Hidaka

USPTO Granted Patents = 31 

Average Co-Inventor Count = 5.4

ph-index = 10

Forward Citations = 312(Granted Patents)


Location History:

  • Hitachiohta, JP (2003 - 2006)
  • Tsuchiura, JP (2008)
  • Hitahiota, JP (2010)
  • Hitachioota, JP (1999 - 2013)
  • Hitachi, JP (1996 - 2014)
  • Hitachiota, JP (1999 - 2014)

Company Filing History:


Years Active: 1996-2014

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31 patents (USPTO):

Title: **Kishio Hidaka: A Pioneer in Scanning Probe Microscopy**

Introduction

Kishio Hidaka, an innovative inventor hailing from Hitachiota, Japan, has made significant contributions to the field of microscopy with an impressive portfolio of 31 patents. His work primarily focuses on enhancing the capabilities of scanning probe microscopes, which are essential tools in the field of nanotechnology.

Latest Patents

Hidaka's latest patents include groundbreaking advancements in scanning probe microscopy and sample observing methods. His developments address key limitations in traditional near-field scanning microscopes that often struggle with issues of resolution and measurement reproducibility. By fabricating a plasmon-enhanced near-field probe that combines a nanometer-order cylindrical structure with nanometer-order microparticles, he enables measurements of optical data and surface unevenness at unprecedented resolution. This innovative approach minimizes damage to both the probe and the sample, allowing for high-quality data acquisition.

Career Highlights

Kishio Hidaka has built his career working with notable companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His tenure at these organizations has been marked by a relentless pursuit of excellence in scientific research and development. His inventions have helped propel the practical applications of microscopy technology into new realms, benefiting various industries and scientific fields.

Collaborations

Throughout his career, Hidaka has collaborated with esteemed colleagues including Mitsuo Hayashibara and Tadashi Fujieda. These collaborations have fostered an environment of innovation that has led to the advancement of key technologies in microscopy. Together, they have pushed the boundaries of what is possible in scientific observations at the nanoscale.

Conclusion

Kishio Hidaka's contributions to scanning probe microscopy underscore the importance of innovation in scientific discovery and technological advancement. With his extensive background, numerous patents, and collaborative efforts, he continues to influence the field profoundly, paving the way for future advancements in microscopy and beyond. His work exemplifies how dedicated inventors can shape the landscape of modern science with ingenuity and precision.

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