Kevin O'Brien

Title: Kevin O'Brien: Innovator in Metrology and Measurement Technologies

Introduction

Kevin O'Brien is a distinguished inventor based in Menlo Park, California. He holds a total of nine patents, showcasing his significant contributions to the fields of metrology and measurement technologies. His innovative work has had a profound impact on various industries, particularly in the realm of semiconductor fabrication.

Latest Patents

Among his latest patents is a "Sample transport device with integrated metrology." This invention features a metrology system that includes casings fitting within the interior cavity of a sample transport device. It incorporates an illumination source, illumination optics, collection optics, and detectors to generate metrology data based on light collected from the sample. Another notable patent is the "Method and system for measuring radiation and temperature exposure of wafers along a fabrication process line." This device includes a wafer assembly with cavities and a detector assembly equipped with light sensors to measure ultraviolet light intensity and temperature during the fabrication process.

Career Highlights

Kevin O'Brien has worked with prominent organizations, including Kla Tencor Corporation and Arizona State University. His experience in these institutions has allowed him to develop and refine his innovative ideas, contributing to advancements in measurement technologies.

Collaborations

Throughout his career, Kevin has collaborated with notable colleagues such as Earl M. Jensen and Mei H. Sun. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Kevin O'Brien's contributions to metrology and measurement technologies are significant and impactful. His innovative patents and collaborations reflect his dedication to advancing the field. His work continues to influence the industry and inspire future innovations.