The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Jun. 07, 2012
Applicants:

Earl Jensen, Santa Clara, CA (US);

Mei Sun, Los Altos, CA (US);

Kevin O'brien, Menlo Park, CA (US);

Inventors:

Earl Jensen, Santa Clara, CA (US);

Mei Sun, Los Altos, CA (US);

Kevin O'Brien, Menlo Park, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 1/58 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 1/58 (2013.01); G01J 3/0205 (2013.01); G01J 3/0256 (2013.01); G01J 3/0259 (2013.01); G01J 3/0262 (2013.01); G01J 3/36 (2013.01); G01J 2003/1213 (2013.01);
Abstract

A sensor apparatus for measuring characteristics of optical radiation has a substrate and a low profile spectrally selective detection system located within the substrate at one or more spatially separated locations. The spectrally selective detection system includes a generally laminar array of wavelength selectors optically coupled to a corresponding array of optical detectors. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.


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