Company Filing History:

9 out of 3,715

Lsi Logic Corporation

patents

At&t Global Information Solutions Company

patents

4. 1 out of 195

Hyundai Electronics America, Inc.

where one patent can have more than one assignee

Years Active: 1997-2008

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12 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7375570 - High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices (2008-05-20),

2. 7272763 - Built-in self test circuitry for process monitor circuit for rapidchip and ASIC devices (2007-09-18),

3. 7240264 - Scan test expansion module (2007-07-03),

4. 7216279 - Testing with high speed pulse generator (2007-05-08),

5. 7202656 - Methods and structure for improved high-speed TDF testing using on-chip PLL (2007-04-10),

6. 7152012 - Four point measurement technique for programmable impedance drivers RapidChip and ASIC devices (2006-12-19),

7. 7106074 - Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devices (2006-09-12),

8. 7081841 - Analog to digital converter built in self test (2006-07-25),

9. 7042242 - Built-in self test technique for programmable impedance drivers for RapidChip and ASIC drivers (2006-05-09),

10. 6408265 - Metastability risk simulation analysis tool and method (2002-06-18),

11. 6216254 - Integrated circuit design using a frequency synthesizer that automatically ensures testability (2001-04-10),

12. 5701309 - Automated test equipment digital tester expansion apparatus (1997-12-23),

Title: The Innovative Contributions of Kevin J Gearhardt

Introduction

Kevin J Gearhardt is a notable inventor based in Fort Collins, CO. He has made significant contributions to the field of technology, particularly in the area of testing and circuit design. With a total of 12 patents to his name, Gearhardt has developed innovative solutions that address critical challenges in the industry.

Latest Patents

Among his latest patents is a groundbreaking circuit designed for high-speed TDF testing on low-cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices. This invention facilitates TDF testing without the need for expensive new test equipment, overcoming the limitations of current testing platforms. Another notable patent is the built-in self-test circuitry for process monitor circuits, which provides a comprehensive testing approach that can be utilized across various tester platforms. This innovation enhances the reliability of testing by analyzing captured values and indicating test results efficiently.

Career Highlights

Throughout his career, Gearhardt has worked with prominent companies such as LSI Logic Corporation and LSI Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the advancement of technology in significant ways.

Collaborations

Gearhardt has collaborated with several professionals in the field, including Douglas J Feist and Doug Feist. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Kevin J Gearhardt's contributions to the field of technology through his patents and career achievements highlight his role as a leading inventor. His innovative solutions continue to impact the industry positively.

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