College Station, TX, United States of America

Kent J Gillig

This inventor holds 5 USPTO granted patents and 3 EPO patents. Top assignees: Ionwerks, Inc., Other. Active years: 2003-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kent J Gillig. Retrieved from https://idiyas.com/inventor/kent-j-gillig

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 80.0


Average Co-Inventor Count = 4.2

ph-index = 5

Forward Citations = 88(Granted Patents)


Company Filing History:


Years Active: 2003-2006

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5 patents (USPTO):Explore Patents

Title: Kent J Gillig: Innovator in Mass Spectrometry

Introduction

Kent J Gillig is a prominent inventor based in College Station, TX (US). He has made significant contributions to the field of mass spectrometry, holding a total of 5 patents. His work focuses on developing advanced instruments that enhance the monitoring of fast processes.

Latest Patents

Among his latest innovations is a time-of-flight mass spectrometer designed for monitoring fast processes. This instrument utilizes an interleaved timing scheme and a position-sensitive detector, allowing for improved accuracy and efficiency. The combination of these methods represents a significant advancement in the field, enabling researchers to obtain real-time data with greater precision.

Career Highlights

Kent has worked with Ionwerks, Inc., where he applied his expertise in mass spectrometry to develop cutting-edge technologies. His career is marked by a commitment to innovation and excellence in scientific research.

Collaborations

Throughout his career, Kent has collaborated with notable professionals in the field, including Katrin Fuhrer and Marc Gonin. These partnerships have contributed to the advancement of mass spectrometry technologies.

Conclusion

Kent J Gillig's contributions to mass spectrometry through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the development of advanced scientific instruments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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