The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Feb. 28, 2001
Applicants:

Katrin Fuhrer, Houston, TX (US);

Kent J. Gillig, College Station, TX (US);

Marc Gonin, Houston, TX (US);

David H. Russell, College Station, TX (US);

John A. Schultz, Houston, TX (US);

Inventors:

Katrin Fuhrer, Houston, TX (US);

Kent J. Gillig, College Station, TX (US);

Marc Gonin, Houston, TX (US);

David H. Russell, College Station, TX (US);

John A. Schultz, Houston, TX (US);

Assignee:

Ionwerks, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J049/40 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Additionally, novel combinations and configurations of components are used to simultaneously maintain a well defined ion packet and preserve sample throughput to the detector.


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