The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Oct. 20, 2003
Applicants:

Katrin Fuhrer, Bern, CH;

Marc Gonin, Bern, CH;

Kent J. Gillig, College Station, TX (US);

Thomas Egan, Houston, TX (US);

Michael I. Mccully, Houston, TX (US);

John A. Schultz, Houston, TX (US);

Inventors:

Katrin Fuhrer, Bern, CH;

Marc Gonin, Bern, CH;

Kent J. Gillig, College Station, TX (US);

Thomas Egan, Houston, TX (US);

Michael I. McCully, Houston, TX (US);

John A. Schultz, Houston, TX (US);

Assignee:

Ionwerks, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Time-of-flight mass spectrometer instruments for monitoring fast processes using an interleaved timing scheme and a position sensitive detector are described. The combination of both methods is also described.


Find Patent Forward Citations

Fuhrer, Katrin. (2006). Time-of-flight mass spectrometer for monitoring of fast processes (U.S. Patent No. 7019286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7019286

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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