Company Filing History:
Years Active: 2011-2021
Title: Kent Erington: Innovator in Laser-Assisted Device Alteration
Introduction
Kent Erington is a notable inventor based in Austin, TX (US), recognized for his contributions to the field of laser-assisted device alteration. With a total of 6 patents, Erington has made significant advancements in technology that enhance the testing and alteration of integrated circuits.
Latest Patents
Erington's latest patents include innovative methods and apparatuses that utilize synchronized pulsed laser technology. One of his key inventions is the "Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets." This method allows for the extraction of timing diagrams by spatially positioning the laser beam on specific circuit features and scanning the arrival time of the laser pulse. Another notable invention is the "Single-Photon Laser-Assisted Device Alteration apparatus," which applies picosecond laser pulses to alter devices at the silicon band-gap level. Additionally, the "Two-Photon Laser-Assisted Device Alteration apparatus" employs femtosecond laser pulses for similar purposes. These inventions enable precise alterations in digital circuits while mapping defects and variations in output during testing.
Career Highlights
Throughout his career, Kent Erington has worked with prominent companies such as NXP USA, Inc. and Freescale Semiconductor, Inc. His experience in these organizations has contributed to his expertise in integrated circuit technology and laser applications.
Collaborations
Erington has collaborated with notable professionals in his field, including Daniel Joseph Bodoh and Kristofor J. Dickson. These collaborations have further enriched his work and innovations in laser-assisted technologies.
Conclusion
Kent Erington stands out as a significant figure in the realm of laser-assisted device alteration, with a strong portfolio of patents that reflect his innovative spirit and technical expertise. His contributions continue to influence advancements in integrated circuit testing and modification.