The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
Apr. 17, 2018
Applicant:
Nxp Usa, Inc., Austin, TX (US);
Inventors:
Daniel Joseph Bodoh, Austin, TX (US);
Kent Bradley Erington, Austin, TX (US);
Assignee:
NXP USA, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/311 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/311 (2013.01); G01R 31/3177 (2013.01); G01R 31/31725 (2013.01);
Abstract
Digital testing is performed on an integrated circuit while radiation upsets are induced at locations of the integrated circuit. For each digital test, a determination is made as to whether there is a variation in the output of the digital test from an expected output of the digital test. If there is variation, a time of the variation is indicated. In one example, a location of a defect in the digital circuit can be determined from the times of the variations. In other embodiments, a mapping of the digital circuit can be made from the times.