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Kenji Yamanishi

USPTO Granted Patents = 9 (Patent Applications = 1)

Average Co-Inventor Count = 2.0

ph-index = 7

Forward Citations = 204(Granted Patents)

Location History:

Tokyo, JP (2000 - 2010)
Minato-ku, JP (2012)

Company Filing History:

9 out of 35,658

Nec Corporation

Years Active: 2000-2012

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9 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8250005 - Change-point detecting method and apparatus (2012-08-21),

2. 7660707 - Dynamic model detecting apparatus (2010-02-09),

3. 7561991 - Detection of abnormal behavior using probabilistic distribution estimation (2009-07-14),

4. 7353214 - Outlier determination rule generation device and outlier detection device, and outlier determination rule generation method and outlier detection method thereof (2008-04-01),

5. 7346593 - Autoregressive model learning device for time-series data and a device to detect outlier and change point using the same (2008-03-18),

6. 7333923 - Degree of outlier calculation device, and probability density estimation device and forgetful histogram calculation device for use therein (2008-02-19),

7. 7016797 - Change-point detection apparatus, method and program therefor (2006-03-21),

8. 6876990 - Questionnaire analysis system (2005-04-05),

9. 6094653 - Document classification method and apparatus therefor (2000-07-25),

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