The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Feb. 17, 2004
Yuko Matsunaga, Tokyo, JP;
Kenji Yamanishi, Tokyo, JP;
Yuko Matsunaga, Tokyo, JP;
Kenji Yamanishi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Supplied with a string of vector data as input data, a probabilistic distribution estimation apparatus estimates, by using a stochastic model having hidden variables, a probabilistic distribution in which each data occurs by successively reading the train of vector data. Specifically, the probabilistic distribution estimation apparatus reads values of parameters of the stochastic model having the hidden variables for a value of the input data, calculates, by using the stochastic model, a certainty in which the input data occurs, renews the parameters in response to new read data with past data forgotten, and produce several parameter's values. By using the parameter's values received from the probabilistic distribution estimation apparatus, an abnormality detection unit calculates an information amount of data as an abnormal behavior degree to produce the abnormal behavior degree.