The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Sep. 29, 2000
Kenji Yamanishi, Tokyo, JP;
Jun-ichi Takeuchi, Tokyo, JP;
Kenji Yamanishi, Tokyo, JP;
Jun-ichi Takeuchi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Degree of outlier of one input data is calculated by an amount of change in a learned probability density from that before learning as a result of taking in of the input data. This is because data largely differing in a tendency from a so far learned probability density function can be considered to have a high degree of outlier. More specifically, a function of a distance between probability densities before and after data input is calculated as a degree of outlier. Accordingly, a probability density estimation device appropriately estimates a probability distribution of generation of unfair data while sequentially reading a large volume of data and a score calculation device calculates and outputs a degree of outlier of each data based on the estimated probability distribution.