The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Jun. 25, 2002
Kenji Yamanishi, Tokyo, JP;
Jun-ichi Takeuchi, Tokyo, JP;
Kenji Yamanishi, Tokyo, JP;
Jun-ichi Takeuchi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An outlier detection device for detecting abnormal data in a data set an outlier rule preservation unit, a filtering unit, a degree of outlier calculation unit, a sampling unit, and a supervised learning unit. The supervised learning unit generates a new rule characterizing abnormal data by supervised learning based on a set of the respective data to which a label indicating whether data is abnormal data or not is applied. The new rule is added to the set of rules held in the outlier rule preservation unit to update the rules. The filtering unit uses the rules for determining whether each data of the data set is abnormal or not. The abnormal data is compared to normal data for calculating a degree of abnormality by the degree of outlier calculation unit.