This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Keyence Corporation. Active years: 2012-2026.
Company Filing History:
Years Active: 2012-2026
Title: Kengo Yanase: Innovator in Optical Measurement Technologies
Introduction
Kengo Yanase is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of optical measurement technologies, holding a total of 4 patents. His work focuses on developing advanced imaging systems that enhance measurement accuracy and efficiency.
Latest Patents
One of Yanase's latest inventions is the white light interference microscope. This innovative device includes an imaging part that captures interference images, a laser light source, and a light receiving part that generates a light reception signal based on the intensity of reflected light from a sample. The microscope features a focal calculation part that determines the optimal focal position, ensuring precise measurements of the sample's surface shape through multiple interference images.
Another notable invention is the image measurement apparatus. This apparatus is designed to search for workpieces by performing a first stage operation. It generates images in various imaging fields while moving the stage according to a predetermined sequence. Upon locating a workpiece, the apparatus transitions to a second stage operation, generating a joined image that encompasses the entire workpiece for display.
Career Highlights
Kengo Yanase is associated with Keyence Corporation, a leading company in the field of automation and measurement technologies. His work at Keyence has allowed him to push the boundaries of optical measurement, contributing to advancements that benefit various industries.
Collaborations
Yanase has collaborated with notable colleagues, including Shinya Takahashi and Takashi Naruse. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Kengo Yanase's contributions to optical measurement technologies exemplify his dedication to innovation. His patents reflect a commitment to enhancing measurement accuracy and efficiency in various applications.