The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Jul. 31, 2019
Keyence Corporation, Osaka, JP;
KEYENCE CORPORATION, Osaka, JP;
Abstract
The image measurement apparatus searches for a workpiece by performing a first stage operation. The image measurement apparatus generates an image in each imaging field-of-view while moving the stage according to a predetermined sequence, and determines whether or not the workpiece is included in each image. When the workpiece is found, the image measurement apparatus switches from the first stage operation to a second stage operation. The image measurement apparatus generates an image in one or more imaging field-of-views located in a direction in which the workpiece extends, among a plurality of imaging field-of-views located around the imaging field-of-view on the stage, in which the image has been obtained. The image measurement apparatus joins a plurality of images generated in the second stage operation to generate a joined image including the whole workpiece, and displays the joined image.