The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2024
Filed:
Jul. 07, 2021
Keyence Corporation, Osaka, JP;
Kengo Yanase, Osaka, JP;
KEYENCE CORPORATION, Osaka, JP;
Abstract
A white light interference microscope includes an imaging part taking interference images, a laser light source, a light receiving part receiving reflected light of laser beam from a sample via a confocal optical system and generating a light reception signal corresponding to the light receiving intensity of the reflected light, a focal calculation part calculating a focal position matching a focus of the objective lens with a surface of the sample based on the light reception signal at each height position of the stage or the objective lens, a focus adjustment part adjusting the height position of the stage or the objective lens to match with the focal position, and a first measuring part measuring the surface shape of the sample based on a plurality of interference images taken by the imaging part at a plurality of height positions defined within a height range including the focal position.