Keith Jordan White

Title: Keith Jordan White: Innovator in Semiconductor Testing

Introduction

Keith Jordan White is a notable inventor based in Richmond, VA, who has made significant contributions to the field of semiconductor testing. With a total of two patents to his name, White has developed innovative methods that enhance the efficiency and accuracy of memory device identification and testing.

Latest Patents

White's latest patents include a "Method for reading semiconductor die information in a parallel test and burn-in system." This method provides a systematic approach to determining memory device identification by invoking a serial output from identification fuses of multiple memory devices. The process involves sampling the serial output to determine the fuse state for each device, ultimately generating a pass/fail string that is crucial for identifying devices during testing. Additionally, he has patented "On-chip circuits for high speed memory testing with a slow memory tester." This invention allows for the testing of memory systems on a semiconductor body by utilizing a programmable clock signal generator and a counter to access separate memory locations efficiently.

Career Highlights

Keith Jordan White is currently employed at Infineon Technologies Richmond, LP, where he continues to innovate in the semiconductor industry. His work focuses on improving testing methodologies that are essential for the reliability of memory devices.

Collaborations

Throughout his career, White has collaborated with talented professionals, including Mark Daniel Eubanks and Joerg Volrath. These collaborations have contributed to the advancement of