Infineon Technologies Richmond, LP

Keith Jordan White

Mark Daniel Eubanks

Joerg Volrath

A method according to the present invention is provided for determining memory device identification. The method invokes a serial output from n identification fuses of two or more memory devices, the output for identifying the device, and sampling the serial output every n bit to determine a fuse state for a fuse of each device. The method further repeats the sampling for all n fuses to acquire fuse data for all devices, and determines a pass/fail string corresponding to the sampled output, the pass/fail string being employed to identify the devices through a parallel test and burn-in system. The output is on an enabled data line which is used during the burn-in test wherein other data lines are disabled for avoiding bus contention. The method also includes storing the pass/fail string for the data in a database, and translating the pass/fail string using a structured query language expression executed against the database.

Method for reading semiconductor die information in a parallel test and burn-in system

A memory system on a semiconductor body is tested by testing components formed on the semiconductor body. A programmable clock signal generator receives an external clock signal and selectively generates an output clock signal having a frequency at a predetermined multiple of the received external clock signal. A counter receives the output clock signal from the clock signal generator and generates output signals having a cyclical binary count up to the predetermined multiple of the received external clock signal. Memory locations in a programmable look-up memory store separate commands for testing the memory system. The programmable look-up memory receives each of selective remotely generated binary encoded address signals to access a separate predetermined look-up memory section, and the binary output signals from the counter for sequentially accessing separate memory locations within the separate predetermined look-up memory section.

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Richmond, VA, United States of America

Keith Jordan White