Hitachinaka, Japan

Keiichi Saiki


Average Co-Inventor Count = 8.3

ph-index = 3

Forward Citations = 70(Granted Patents)


Company Filing History:


Years Active: 2003-2004

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3 patents (USPTO):Explore Patents

Title: Keiichi Saiki: Innovator in Circuit Inspection Technology

Introduction

Keiichi Saiki is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of circuit inspection technology, holding a total of 3 patents. His work focuses on improving the efficiency and accuracy of inspecting circuit patterns and detecting defects.

Latest Patents

One of his latest patents is a method of inspecting circuit patterns and an inspecting instrument. This invention aims to optimize the irradiation conditions of an electron beam based on the material and structure of the circuit pattern being inspected. The device allows for the detection of secondary electrons and stores the obtained signals for comparison, enabling the identification of failures based on predetermined threshold values. Another significant patent involves an apparatus and method for inspecting foreign particles or defects on a sample. This method includes irradiating light onto the object, detecting reflected or scattered light, and providing information about the size and distribution of any foreign particles or defects detected.

Career Highlights

Throughout his career, Keiichi Saiki has worked with prominent companies, including Hitachi, Ltd. His expertise in circuit inspection technology has positioned him as a valuable asset in the industry.

Collaborations

He has collaborated with notable coworkers such as Kenji Watanabe and Mari Nozoe, contributing to advancements in their respective fields.

Conclusion

Keiichi Saiki's innovative work in circuit inspection technology has led to significant advancements in the industry. His patents reflect a commitment to enhancing the accuracy and efficiency of inspection processes.

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