Katsushi Sugai

Title: Katsushi Sugai: Semiconductor Testing Inventions

Introduction

Katsushi Sugai is an inventor based in Saitama, Japan. His work includes inventions for semiconductor wafer testing, with a focus on probe apparatus and test-use substrates. He is associated with Advantest Corporation and Shinko Electric Industries Co., Ltd. His listed patent portfolio includes 3 patents.

Latest Patents

Sugai’s listed patents address components and systems used to test semiconductor devices and wafers.

- **Probe apparatus and test apparatus.** This invention describes a probe apparatus that electrically connects a device under test to a test apparatus. Its components include a flexible device-side terminal unit, an intermediate substrate, a tester-side substrate, and a contact section with pins connecting the intermediate and tester-side electrodes. The arrangement provides an electrical path between the device and the test apparatus body.

- **Test-use individual substrate, probe, and semiconductor wafer testing apparatus.** This invention concerns an individual substrate for testing a semiconductor wafer. The substrate has a main body, thinner portions extending from the main body, and bumps on those thinner portions. The stated objective is to improve testing accuracy and connection reliability.

Career Highlights

Sugai’s patent work reflects an emphasis on the electrical interfaces and substrate structures used in semiconductor testing. His listed company affiliations connect his career with organizations involved in semiconductor test equipment and electronic components.

Collaborations

Sugai’s listed coworkers include Shigeru Matsumura and Mitsutoshi Higashi. Their names provide context for the professional network associated with his work.

Conclusion

Katsushi Sugai’s listed inventions focus on probe systems and test substrates designed to support reliable electrical connections and accurate semiconductor testing.