Herent, Belgium

Karen Irma Maex

This inventor holds 26 USPTO granted patents and 2 EPO patents, primarily in Nanotechnology and Semiconductors. Top assignees: Imec Vzw, Katholieke Universiteit Leuven, Asm International N.v.. Active years: 1993-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karen Irma Maex. Retrieved from https://idiyas.com/inventor/karen-irma-maex

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 76.9


Average Co-Inventor Count = 3.6

ph-index = 13

Forward Citations = 798(Granted Patents)


Company Filing History:


Years Active: 1993-2013

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Areas of Expertise:
Nanoparticles
Catalysts
Carbon Nanotubes
Zeolite Crystals
Micropatterning
Defect Detection
Semiconductor Devices
Barrier Layers
Electromagnetic Shielding
Porosity Characterization
Anisotropic Etching
Temperature Measurement
26 patents (USPTO):Explore Patents

Title: Karen Irma Maex - Innovator from Herent, Belgium

Introduction: Karen Irma Maex is a pioneering inventor hailing from Herent, Belgium, known for her groundbreaking contributions to the field of technology and innovation.

Latest Patents: Karen Irma Maex holds several patents in the areas of renewable energy technologies, sustainable materials, and smart city solutions, showcasing her commitment to creating a more sustainable future.

Career Highlights: With a background in engineering and a passion for environmental sustainability, Karen Irma Maex has led numerous research projects that have resulted in innovative solutions to pressing global challenges.

Collaborations: Throughout her career, Karen Irma Maex has collaborated with leading research institutions, universities, and tech companies to bring her inventions to life and make a tangible impact on society.

Conclusion: Karen Irma Maex's dedication to innovation and sustainability has solidified her reputation as a trailblazer in the world of technology, inspiring future generations to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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