Location History:
- Endicott, NY (US) (1997)
- Vescal, NY (US) (2003 - 2006)
- Vestal, NY (US) (2003 - 2007)
Company Filing History:
4 out of 2,546 
3 out of 164,219 
Years Active: 1997-2007
Title: The Innovative Contributions of Kamran K Zarrineh
Introduction
Kamran K Zarrineh is a notable inventor based in Endicott, NY (US). He has made significant contributions to the field of memory testing technology, holding a total of 7 patents. His work focuses on enhancing the efficiency and effectiveness of multi-port memory systems.
Latest Patents
One of his latest patents is titled "Programmable Multi-Port Memory BIST with Compact Microcode." This invention describes a microcode programmable built-in-self-test (BIST) circuit and method for testing multi-ported memory. The system allows for testing via multiple ports, either simultaneously or sequentially, as directed by a microcode instruction word. The instruction word contains several executable subinstructions and a control bit that determines whether the test operations are executed in parallel or in series. The architecture of the BIST facilitates flexible testing of multiple devices, including complex multi-ported memory structures. It supports in-situ testing of memory functionality at various stages, including wafer, module, burn-in, and system-level testing.
Another significant patent is the "Method and Apparatus for Testing Multi-Port Memories." This invention provides a method and system for testing multi-ported memories, particularly when some ports are not directly accessible. The method segregates the multi-ported memory into at least two portions, allowing for effective testing of the inaccessible ports.
Career Highlights
Kamran K Zarrineh has worked with prominent companies in the technology sector, including Cadence Design Systems, Inc. and IBM. His experience in these organizations has contributed to his expertise in memory testing technologies.
Collaborations
Throughout his career, Zarrineh has collaborated with notable professionals, including R Dean Adams and Thomas J Eckenrode. These collaborations have further enriched his work and innovations in the field.
Conclusion
Kamran K Zarrineh's contributions to memory testing technology through his innovative patents have significantly advanced the field. His work continues to influence the development of efficient memory systems, showcasing the importance of innovation in technology.