The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Jul. 26, 2000
R. Dean Adams, St. George, VT (US);
Thomas J. Eckenrode, Endicott, NY (US);
Steven L. Gregor, Endicott, NY (US);
Kamran Zarrineh, Vestal, NY (US);
R. Dean Adams, St. George, VT (US);
Thomas J. Eckenrode, Endicott, NY (US);
Steven L. Gregor, Endicott, NY (US);
Kamran Zarrineh, Vestal, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The functionality of a programmable memory built-in self-test (BIST) arrangement for testing an embedded memory structure of an integrated circuit is extended to system level testing to ascertain operability of the system after the integrated circuits and boards including them have been placed in service in larger systems, by generating default test signals which are loaded in an instruction store module when test instructions are not provided from an external tester. This additional utility of the BIST arrangement, increases efficiency of chip space utilization and improves the system level test. Loading of test instructions from an external tester during chip manufacture and/or board assembly is unaffected.