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For the Inventor, By the Inventor

Saitama, Japan

Kamihisa Endo

USPTO Granted Patents = 4


Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 16(Granted Patents)


Location History:

  • Akishima, JP (2005)
  • Saitama, JP (2005 - 2006)
  • Tokyo, JP (2008)

Company Filing History:

goldMedal4 out of 286 
 
Rigaku Corporation
 patents

Years Active: 2005-2008

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4 patents (USPTO):Explore Patents
1. 7337098 - Diffraction condition simulation device, diffraction measurement system, and crystal analysis system (2008-02-26),
2. 7003074 - Stress measurement method using X-ray diffraction (2006-02-21),
3. 6937694 - Pole measuring method (2005-08-30),
4. 6874369 - Stress measurement method using X-ray diffraction (2005-04-05),
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