Junichiro Shibata

Title: Junichiro Shibata: Innovator in Semiconductor Technology

Introduction

Junichiro Shibata is a notable inventor based in Urawa, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving the efficiency of semiconductor wafer probing methods.

Latest Patents

Shibata's latest patents include a semiconductor wafer probing method that aims to reduce the number of indexing or wafer transfer operations while enhancing verification efficiency. This method involves a probe card equipped with a first plurality of upright probe needles corresponding to chips arranged in both vertical and horizontal directions. The defined index regions minimize the occurrences where probe needles lack a chip to contact during the relative movement of the wafer and needles. Additionally, he has developed a probe apparatus designed to test the electrical characteristics of chips on a semiconductor wafer. This apparatus features vertically mounted probes that connect to a main PCB of a probe card, allowing for efficient testing and easy replacement of components.

Career Highlights

Throughout his career, Junichiro Shibata has worked with prominent companies in the semiconductor industry, including Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His expertise in semiconductor technology has positioned him as a valuable asset in these organizations.

Collaborations

Shibata has collaborated with notable colleagues such as Hiroshi Marumo and Gakuji Sasamoto, contributing to advancements in semiconductor technology through teamwork and shared expertise.

Conclusion

Junichiro Shibata's innovative work in semiconductor wafer probing methods and apparatuses has significantly impacted the efficiency of testing in the semiconductor industry. His contributions continue to influence advancements in technology.