Underhill, VT, United States of America

Joseph J Van Horn


Average Co-Inventor Count = 10.4

ph-index = 3

Forward Citations = 79(Granted Patents)


Company Filing History:


Years Active: 1996-2004

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4 patents (USPTO):Explore Patents

Title: Joseph J Van Horn: A Pioneer in Microelectronics Testing

Introduction

Joseph J Van Horn, based in Underhill, Vermont, is an accomplished inventor with four patents to his name. His innovative work primarily focuses on advancing testing methodologies for microelectronics, particularly in the development of integrated circuit chips. His contributions are significant in enhancing the efficiency and reliability of electronic products.

Latest Patents

Van Horn's latest inventions include two notable patents. The first is a **Temporary Device Attach Structure for Test and Burn-In of Microjoint Interconnects and Method for Fabricating the Same**. This system is designed to test a collection of device chips by temporarily attaching them to a reusable carrier equipped with microdendritic features, allowing for comprehensive testing of the chips as a whole.

The second patent is the **Segmented Architecture for Wafer Test and Burn-In**. This innovative apparatus facilitates simultaneous testing or burn-in of many integrated circuit chips on a product wafer. It utilizes two boards—one for probes and another for tester chips—to manage power distribution and testing, significantly improving the thermal management of the testing process.

Career Highlights

Joseph Van Horn has made significant strides in the microelectronics sector during his tenure at International Business Machines Corporation (IBM). His expertise in device testing has not only led to multiple patents but has also enhanced the reliability and efficiency of numerous electronic products developed by the company.

Collaborations

Throughout his career, Van Horn has collaborated with notable colleagues, including George Frederick Walker and Thomas W Bachelder. These collaborations have helped foster a climate of innovation and teamwork, driving forward advancements in microelectronics testing methodologies.

Conclusion

Joseph J Van Horn exemplifies the spirit of innovation in the field of microelectronics. With his groundbreaking patents and collaborative efforts at IBM, he continues to pave the way for more efficient testing systems in the electronics industry. His work not only reflects his talent as an inventor but also contributes substantially to the advancement of technology.

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