The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2004

Filed:

Jan. 18, 2002
Applicant:
Inventors:

John Harold Magerlein, Yorktown Heights, NY (US);

Samuel Roy McKnight, New Paltz, NY (US);

Kevin Shawn Petrarca, Newburgh, NY (US);

Sampath Purushothaman, Yorktown Heights, NY (US);

Carlos Juan Sambucetti, Croton-on-Hudson, NY (US);

Joseph J. Van Horn, Underhill, VT (US);

Richard Paul Volant, New Fairfield, CT (US);

George Frederick Walker, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ;
U.S. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ;
Abstract

A system for testing a collection of device chips by temporarily attaching them to a carrier having a plurality of receptacles with microdendritic features; the receptacles matching with and pushed in contact with a matching set of contact pads on the device chips; said carrier additionally having test pads connected to the receptacles through interconnect wiring. The system allows connecting the chips together and testing the collection as a whole by probing the test pads on the carrier. Burn-in of the collection of chips can also be performed on the temporary carrier, which is reusable.


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