Gwangmyeong, South Korea

Jongjin Choi

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Koh Young Technology Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jongjin Choi. Retrieved from https://idiyas.com/inventor/jongjin-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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2 patents (USPTO):Explore Patents

Title: Jongjin Choi: Innovator in Substrate Inspection Technologies

Introduction

Jongjin Choi is a notable inventor based in Gwangmyeong-si, South Korea. He has made significant contributions to the field of substrate inspection technologies, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of circuit board inspections.

Latest Patents

Jongjin Choi's latest patents include a method of generating a compensation matrix during a substrate inspection. This invention involves selecting information from feature objects within a field of view on a substrate, generating a first compensation matrix, and comparing offset values to optimize inspection processes. Another significant patent is a method of generating reference data for inspecting a circuit board. This method enhances inspection efficiency by quickly generating reference data without the need for CAD information.

Career Highlights

Jongjin Choi is currently employed at Koh Young Technology Inc., a company known for its advanced inspection solutions. His innovative approaches have contributed to the company's reputation in the industry.

Collaborations

Some of his coworkers include Seungwon Jung and Heewook You, who collaborate with him on various projects within the company.

Conclusion

Jongjin Choi's contributions to substrate inspection technologies demonstrate his commitment to innovation and efficiency in the field. His patents reflect a deep understanding of the challenges in circuit board inspections and offer practical solutions to enhance the process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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