The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Sep. 11, 2014
Applicant:

Koh Young Technology Inc., Seoul, KR;

Inventors:

Seungwon Jung, Seoul, KR;

Jongjin Choi, Gwangmyeong-si, KR;

Heewook You, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G01N 21/93 (2006.01); G01N 21/956 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01B 11/002 (2013.01); G01N 21/93 (2013.01); G01N 21/956 (2013.01); G01N 21/95607 (2013.01); G01N 21/95684 (2013.01); G06T 7/0004 (2013.01); G06T 7/0006 (2013.01); G01N 2201/13 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01);
Abstract

The present invention relates to a method of generating reference data for inspecting a circuit board. The method comprises steps of scanning a bare circuit board to obtain image information of the bare circuit board, generating a compensation matrix using pad coordinate information extracted from the image information and pad coordinate information prestored in design data, and generating, by applying the compensation matrix to the image information, a reference data including coordinate information of a distinctive object. According to the method, inspection efficiency may optimized through quickly generating reference data without CAD information necessary for circuit board inspection.


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