Maple Grove, MN, United States of America

Jonathan Arland Nelson

This inventor holds 4 USPTO granted patents. Top assignee: Seagate Technology Incorporated. Active years: 2008-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jonathan Arland Nelson. Retrieved from https://idiyas.com/inventor/jonathan-arland-nelson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 3

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2008-2018

Loading Chart...
4 patents (USPTO):Explore Patents

Title: Jonathan Arland Nelson: Inventor in Atomic Force Microscopy

Introduction

Jonathan Arland Nelson is an inventor based in Maple Grove, Minnesota, whose work includes innovations in atomic force microscopy (AFM) and image processing. He is associated with Seagate Technology Incorporated and holds 4 patents.

Latest Patents

Nelson’s latest patents address AFM scanning methods and the processing of scan images.

One patent describes scanning the same sample region at two different angles, using component scans at two speeds. The resulting images are compared to correct an error in the first scan image and produce a corrected output.

Another patent concerns generating a topographic profile of a structure with AFM. It scans an area of interest at higher resolution than surrounding portions, then aligns features of the resulting profile with coordinate axes to correct skew and tilt.

Career Highlights

Nelson’s patent work focuses on improving the accuracy and usefulness of AFM measurements. The described methods combine scanning strategies with image correction and profile alignment.

Collaborations

Nelson’s listed coworkers include Lin Zhou and Dale E. Egbert. His work is associated with Seagate Technology Incorporated.

Conclusion

Jonathan Arland Nelson’s inventions apply scanning and image-processing techniques to address accuracy challenges in atomic force microscopy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…