Jon Karl Weiss

Title: Jon Karl Weiss: Innovator and Patent Holder in Electron Microscopy

Introduction:

Meet Jon Karl Weiss, a brilliant innovator hailing from Tempe, AZ (US). With a strong focus on electron microscopy, Weiss has made significant contributions to the field through his groundbreaking inventions and patented technologies. This article delves into his recent patents, career highlights, collaborations, and overall impact in the realm of electron microscopy.

Latest Patents:

Weiss has an impressive total of four patents to his name. One of his latest patents is titled "Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping." This method involves automatically aligning a scanning transmission electron microscope (STEM) to acquire precession electron diffraction (PED) mapping data. By comparing non-inclined and inclined signal spatial distributions, an azimuthal spatial alignment correction is determined.

Another noteworthy patent is for a "Scanning transmission electron microscope" that allows for the acquisition of high-quality precession electron diffraction (PED) patterns. This technology utilizes separate scanning deflectors and precession deflectors, which enables independent optimization and improved performance for both deflection systems.

Career Highlights:

Throughout his career, Weiss has contributed immensely to the field of electron microscopy. His expertise has been leveraged by renowned organizations such as Appfive LLC and the Universitat De Barcelona. With his extensive knowledge and innovative mindset, Weiss has played a pivotal role in advancing electron microscopy techniques, particularly in the realm of precession electron diffraction (PED) analysis.

Collaborations:

Weiss has had the opportunity to collaborate with esteemed professionals in the field of electron microscopy. Notably, he has worked alongside Steven T. Kim and Stavros Nicolopoulos, both experts in their respective areas. These collaborations have undoubtedly fueled innovative thinking and led to further advancements in electron microscopy technologies.

Conclusion:

Jon Karl Weiss is an exceptional innovator and patent holder, making waves in the field of electron microscopy. With his latest patents encompassing automatic alignment methods and high-quality precession electron diffraction, Weiss has solidified his position as a leading figure in this domain. His collaborations with esteemed colleagues further exemplify his commitment to pushing the boundaries of electron microscopy. As we eagerly await his future contributions, we can rest assured knowing that Weiss's work will continue to shape the field and inspire further innovation in electron microscopy.