The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Nov. 19, 2012
Universitat DE Barcelona, Barcelona, ES;
Nanomegas Sprl, Molenbeek-Saint-Jean, BE;
Appfive Llc, Tempe, AZ (US);
Sonia Estrade Albiol, Barcelona, ES;
Joaquin Portillo Serra, Barcelona, ES;
Francisca Peiró Martinez, Barcelona, ES;
José Manuel Rebled Corsellas, Tarragona, ES;
Lluís Yedra Cardona, Barcelona, ES;
Stavros Nicolopoulos, Valencia, ES;
Steven Kim, Phoenix, AZ (US);
Jon Karl Weiss, Tempe, AZ (US);
UNIVERSITAT DE BARCELONA, Barcelona, ES;
NANOMEGAS SPRL, Molenbeek-Saint-Jean, ES;
APPFIVE LLC, Tempe, AZ (US);
Abstract
A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.