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Title: Biography of Sonia Estrade Albiol
Introduction
Sonia Estrade Albiol is an accomplished inventor based in Barcelona, Spain. She has made significant contributions to the field of analytical electron microscopy, particularly in enhancing the quality of spectroscopic measurements.
Latest Patents
Sonia holds a patent for a "Method and system for improving characteristic peak signals in analytical electron microscopy." This innovative method focuses on improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. The technique involves a beam scanning protocol that varies the inclination and azimuthal angle of the incident beam while acquiring spectroscopic data. This method can be effectively applied to compositional mapping.
Career Highlights
Throughout her career, Sonia has worked with prestigious institutions, including the Universitat De Barcelona. Her expertise in analytical techniques has positioned her as a key figure in her field.
Collaborations
Sonia has collaborated with notable colleagues such as Joaquin Portillo Serra and Francisca Peiró Martinez. These partnerships have further enriched her research and contributions to the scientific community.
Conclusion
Sonia Estrade Albiol's innovative work in analytical electron microscopy exemplifies her dedication to advancing scientific knowledge. Her patent and collaborations highlight her impact on the field and her commitment to improving analytical techniques.