Location History:
- Valencia, ES (2012 - 2016)
- Brussels, BE (2016)
Company Filing History:
2 out of 3 
2 out of 2 
1 out of 47 
Years Active: 2012-2016
Title: Innovations by Stavros Nicolopoulos
Introduction
Stavros Nicolopoulos is a notable inventor based in Valencia, Spain. He has made significant contributions to the field of analytical electron microscopy, holding three patents that showcase his innovative approaches to improving measurement techniques in materials science.
Latest Patents
One of his latest patents is titled "Method and system for improving characteristic peak signals in analytical electron microscopy." This invention discloses a method and system designed to enhance characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. The approach involves a beam scanning protocol that varies the inclination and azimuthal angle of the incident beam while spectroscopic data is collected. This method can be applied to compositional mapping, providing more accurate results.
Another significant patent by Nicolopoulos is "System and process for measuring strain in materials at high spatial resolution." This process involves placing a sample of material into a transmission electron microscope (TEM) and energizing it to create a small electron beam with a specific incident angle. The method generates electrical signals that control multiple beam deflection coils and image deflection coils of the TEM. By adjusting these signals, the process minimizes dynamical diffraction effects and allows for the collection of a diffraction pattern from a strained area of the material, enabling precise strain measurements.
Career Highlights
Throughout his career, Stavros Nicolopoulos has worked with various companies, including Nanomegas Sprl and Appfive LLC. His work in these organizations has contributed to advancements in electron microscopy and materials analysis.
Collaborations
Nicolopoulos has collaborated with notable professionals in his field, including Jon Karl Weiss and Steven T Kim. These collaborations have further enriched his research and development efforts.
Conclusion
Stavros Nicolopoulos is a distinguished inventor whose innovative patents have significantly impacted the field of analytical electron microscopy. His work continues to advance the understanding and measurement of materials at high spatial resolutions.