Nanomegas Sprl

Appfive LLC

Universität De Barcelona

Centre National De La Recherche Scientifique

Institut Polytechnique De Grenoble

Universidad De Barcelona

Stavros Nicolopoulos

Jon Karl Weiss

Steven T Kim

Sonia Estrade Albiol

Joaquin Portillo Serra

Francisca Peiró Martinez

José Manuel Rebled Corsellas

Lluís Yedra Cardona

Amith D Darbal

Raman D Narayan

Daniel Bultreys

Edgard Rauch

Joaquim Portillo Serra

Steven Kim

A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.

Method and system for improving characteristic peak signals in analytical electron microscopy

A process for measuring strain is provided that includes placing a sample of a material into a TEM as a sample. The TEM is energized to create a small electron beam with an incident angle to the sample. Electrical signals are generated that control multiple beam deflection coils and image deflection coils of the TEM. The beam deflection control signals cause the angle of the incident beam to change in a cyclic time-dependent manner. A first diffraction pattern from the sample material that shows dynamical diffraction effects is observed and then one or more of the beam deflection coil control signals are adjusted to reduce the dynamical diffraction effects. One or more of the image deflection coil control signals are then adjusted to remove any motion of the diffraction pattern. A diffraction pattern is then collected from a strained area of the material after the adjusting step, and the strain is then determined from a numerical analysis of the strained diffraction pattern compared to a reference diffraction pattern from an unstained area of the material.

System and process for measuring strain in materials at high spatial resolution

A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location () of the sample () to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.

Methods and devices for high throughput crystal structure analysis by electron diffraction

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Valencia, Spain

Stavros Nicolopoulos