Location History:
- Richardson, TX (US) (2017 - 2018)
- McKinney, TX (US) (2019 - 2020)
Company Filing History:
Years Active: 2017-2020
Title: The Innovations of John Thornell
Introduction
John Thornell is an accomplished inventor based in McKinney, TX (US). He has made significant contributions to the field of substrate inspection, holding a total of 4 patents. His work focuses on detecting anomalies and candidate defects in substrates, which is crucial for various applications in the semiconductor industry.
Latest Patents
Thornell's latest patents include innovative approaches for performing substrate inspection. One of his notable patents addresses the inspection of substrates, presenting concepts that relate to detecting anomalies based on contrast in images obtained of the substrate. Another significant patent involves semiconductor device inspection, specifically targeting metallic discontinuities and utilizing similar image contrast techniques to identify defects.
Career Highlights
Throughout his career, John Thornell has worked with reputable companies, including Rudolph Technologies, Inc. His experience in these organizations has allowed him to refine his expertise in substrate inspection and contribute to advancements in the field.
Collaborations
Thornell has collaborated with talented individuals such as Gurvinder Singh and Wu Y Han. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
John Thornell's contributions to substrate inspection through his patents and collaborations highlight his role as a significant inventor in the semiconductor industry. His work continues to influence advancements in technology and quality assurance.