This inventor holds 3 USPTO granted patents. Top assignee: Advanced Micro Devices Corporation. Active years: 2002-2009.
Company Filing History:
Years Active: 2002-2009
Title: John Heon Yi: Innovator in Integrated Circuit Testing
Introduction
John Heon Yi is a notable inventor based in Austin, TX, who has made significant contributions to the field of integrated circuit testing. With a total of 3 patents to his name, Yi has developed innovative solutions that enhance the reliability and efficiency of microprocessors and integrated circuits.
Latest Patents
One of Yi's latest patents is focused on a burn-in test system. This system includes a device under test (DUT), a temperature controller coupled to the DUT, and a test controller. During testing, the test controller sets a parameter of the DUT to a first value and applies a test stimulus to the DUT. It then sets the parameter to a second value and applies the test stimulus again. A change in the value of the parameter results in a change in the amount of heat dissipated by the DUT. The temperature controller maintains the DUT at a pre-determined temperature during testing with the parameter set to both values. Additionally, the DUT may be coupled to a module that simulates a product-level application environment.
Another significant patent by Yi involves temperature control of an integrated circuit. This invention provides an apparatus and method for controlling temperature during pre-delivery testing of microprocessors and integrated circuits. The testing package includes a thermally conductive lid in thermal contact with the microprocessor, covered by a block of thermally conductive material of predetermined thickness. This thickness is a function of the desired temperature profile and the current drawn by the microprocessor undergoing testing.
Career Highlights
John Heon Yi is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work focuses on improving testing methodologies for integrated circuits, ensuring that products meet high standards of performance and reliability.
Collaborations
Throughout his career, Yi has collaborated with talented professionals, including Chandrakant Pandya and Trent Johnson. These collaborations have contributed to the advancement of technology in the field of microprocessor testing.
Conclusion
John Heon Yi is a distinguished inventor whose work in integrated circuit testing has led to innovative patents that enhance product reliability. His contributions at Advanced Micro Devices Corporation reflect his commitment to advancing technology in the semiconductor industry.