The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Jul. 05, 2005
Trent William Johnson, Austin, TX (US);
Steven Russell Klassen, Buda, TX (US);
Jeff Brinkley, Georgetown, TX (US);
Glenn Eubank, Austin, TX (US);
John Heon Yi, Austin, TX (US);
Satwant Singh, San Jose, CA (US);
Michael Gregory Tarin, Austin, TX (US);
Chandrakant Pandya, Pflugerville, TX (US);
Trent William Johnson, Austin, TX (US);
Steven Russell Klassen, Buda, TX (US);
Jeff Brinkley, Georgetown, TX (US);
Glenn Eubank, Austin, TX (US);
John Heon Yi, Austin, TX (US);
Satwant Singh, San Jose, CA (US);
Michael Gregory Tarin, Austin, TX (US);
Chandrakant Pandya, Pflugerville, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A burn-in test system. A burn-in test system includes a device under test (DUT), a temperature controller coupled to the DUT, and a test controller. During testing, the test controller: (a) sets a parameter of the DUT to a first value and applies a test stimulus to the DUT, and (b) sets the parameter of the DUT to a second value and applies the test stimulus to the DUT. A change in the value of the parameter results in a change in the amount of heat dissipated by the DUT. The temperature controller maintains the DUT at a pre-determined temperature during testing with the parameter set to both the first and the second values. The DUT may be further coupled to a module that comprises circuitry employed in a product-level application environment. The module is configured by the test controller to simulate a product-level application.