Tualatin, OR, United States of America

John A Waicukauski


 

Average Co-Inventor Count = 2.9

ph-index = 9

Forward Citations = 313(Granted Patents)


Company Filing History:


Years Active: 2002-2025

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25 patents (USPTO):Explore Patents

Title: John A. Waicukauski: A Pioneer in X-Tolerant Logic Testing

Introduction: John A. Waicukauski, a distinguished inventor based in Tualatin, OR, has made significant contributions to the field of electronics and logic testing, holding a remarkable total of 24 patents. His innovative approaches have played a crucial role in advancing testing methodologies for logic circuits, enhancing their reliability and efficiency.

Latest Patents: Among his latest patents, Waicukauski introduced a system for "Multiple clock and clock cycle selection for x-tolerant logic built in self test (XLBIST)." This invention details a sophisticated method for testing logic using a Logic Built-In Self-Test (LBIST) system that accommodates unknown inputs (Xs) in logic cells. The invention facilitates multiple test system clocks from the LBIST to the logic during a system clock capture cycle, with precise timing control to ensure effective testing.

Another significant patent is titled "Per-shift X-tolerant logic built-in self-test." This circuit includes a first register that identifies a subset of scan chains with specific scan cells to be masked, alongside a second register used in each shift cycle to determine additional scan cells for masking. This layered approach increases the efficiency of logic testing by ensuring that only the necessary elements are focused on during the testing process.

Career Highlights: John A. Waicukauski has dedicated a significant portion of his career to working at Synopsys, Inc., where he has collaborated on developing cutting-edge testing technologies. His deep understanding of logic testing has made him a valuable asset to the company and the broader engineering community.

Collaborations: Throughout his career, Waicukauski has collaborated with other notable experts in the field, including Peter Wohl and Thomas W. Williams. These collaborations have further enriched his inventions and development processes, contributing to the overall advancements in logic circuitry testing.

Conclusion: John A. Waicukauski stands out as a pioneering inventor whose work in x-tolerant logic and testing systems has had a lasting impact on the electronics industry. His patents not only represent technological advancement but also demonstrate a commitment to improving the reliability of essential electronic systems. His contributions continue to inspire future innovations in logic testing methodologies.

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