The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Mar. 05, 2012
Applicants:
Peter Wohl, Williston, VT (US);
John A. Waicukauski, Tualatin, OR (US);
Inventors:
Peter Wohl, Williston, VT (US);
John A. Waicukauski, Tualatin, OR (US);
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method to increase automatic test pattern generation (ATPG) effectiveness and compression identifies instances of 'majority gates' and modifies test generation to exploit their behavior so that fewer care bit are needed. This method can increase test coverage and reduce CPU time as previously aborted faults are now tested. The majority gate enhanced ATPG requires no hardware support and can be applied to any ATPG system.