Eindhoven, Netherlands

Johannes Antonius Maria Van Den Oetelaar

USPTO Granted Patents = 5 

Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2011-2018

Loading Chart...
5 patents (USPTO):Explore Patents

Title: Innovations of Johannes Antonius Maria Van Den Oetelaar

Introduction

Johannes Antonius Maria Van Den Oetelaar is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of microscopy, particularly in the development of charged particle microscopes. With a total of 5 patents to his name, his work has advanced the capabilities of electron tomography and vibration detection.

Latest Patents

Van Den Oetelaar's latest patents include a "Charged particle microscope with vibration detection/correction" and a method for electron tomography. The latter invention addresses the time-consuming nature of electron tomography, which typically requires the acquisition of 50-100 images to form a single tomogram. His innovative method allows for continuous tilting of the sample, significantly reducing the time needed to acquire images and eliminating vibrations between steps.

Career Highlights

He is currently employed at FEI Company, where he continues to push the boundaries of microscopy technology. His work has not only enhanced the efficiency of imaging processes but has also contributed to the overall advancement of scientific research in various fields.

Collaborations

Throughout his career, Van Den Oetelaar has collaborated with talented individuals such as Pleun Dona and Jorn Hermkens. These collaborations have fostered an environment of innovation and creativity, leading to groundbreaking advancements in their respective fields.

Conclusion

Johannes Antonius Maria Van Den Oetelaar's contributions to microscopy and electron tomography exemplify the spirit of innovation. His patents and collaborative efforts continue to influence the scientific community, paving the way for future advancements in technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…