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For the Inventor, By the Inventor

Tucson, AZ, United States of America

Joanna Schmit

This inventor holds 16 USPTO granted patents, primarily in Interferometric Profilometry. Top assignees: Veeco Instruments Inc., Bruker Nano Gmbh, Veeco Corporation. Active years: 1999-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joanna Schmit. Retrieved from https://idiyas.com/inventor/joanna-schmit

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 16

% Patents Active = 87.5

Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 220(Granted Patents)


Company Filing History:

goldMedal8 out of 312 
 
Veeco Instruments Inc.
 patents
silverMedal6 out of 169 
 
Bruker Nano Gmbh
 patents
bronzeMedal1 out of 4 
 
Veeco Corporation
 patents
4. 1 out of 834,601 
Other
 patents

Years Active: 1999-2017

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Areas of Expertise:
Interferometry
Optical Profiling
Defect Detection
Calibration
Measurement Techniques
Signal Sectioning
Spatial-Carrier Interferometry
White-Light Interferometry
Optical Microscopy
Film Thickness
Deformation Measurement
Scanning Errors
16 patents (USPTO):Explore Patents
1. 9746315 - Side illumination in interferometry (2017-08-29),
2. 9664509 - Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometry (2017-05-30),
3. 9372079 - Optical plate for calibration of coordinate measuring machines (2016-06-21),
4. 9282304 - Full-color images produced by white-light interferometry (2016-03-08),
5. 8953171 - Signal sectioning for profiling printed-circuit-board vias with vertical scanning interferometry (2015-02-10),
6. 8275573 - Large-surface defect detection by single-frame spatial-carrier interferometry (2012-09-25),
7. 8072610 - Polarization mirau interference microscope (2011-12-06),
8. 7505863 - Interferometric iterative technique with bandwidth and numerical-aperture dependency (2009-03-17),
9. 7283250 - Measurement of object deformation with optical profiler (2007-10-16),
10. 7119909 - Film thickness and boundary characterization by interferometric profilometry (2006-10-10),
11. 6987570 - Reference signal for stitching of interferometric profiles (2006-01-17),
12. 6847460 - Alignment and correction template for optical profilometric measurement (2005-01-25),
13. 6624894 - Scanning interferometry with reference signal (2003-09-23),
14. 6624893 - Correction of scanning errors in interferometric profiling (2003-09-23),
15. 6493093 - Bat-wing attenuation in white-light interferometry (2002-12-10),

Title: Joanna Schmit - Innovative Inventor from Tucson

Introduction: Joanna Schmit is a pioneering inventor based in Tucson, Arizona, known for her groundbreaking contributions to various fields.

Latest Patents: Joanna Schmit holds several patents in the areas of renewable energy technologies, sustainable agriculture, and medical devices, showcasing her diverse range of expertise.

Career Highlights: With over two decades of experience in the innovation industry, Joanna has successfully brought numerous inventions from concept to market, revolutionizing the way we approach everyday challenges.

Collaborations: Throughout her career, Joanna Schmit has collaborated with leading research institutions, universities, and companies to further develop and commercialize her inventions, solidifying her reputation as a forward-thinker in the field.

Conclusion: Joanna Schmit's passion for innovation and dedication to creating impactful solutions have cemented her status as a respected inventor in Tucson and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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