The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Dec. 24, 2014
Tay-chang Wu, Tucson, AZ (US);
Jaime Duran, Tucson, AZ (US);
John Christopher Boney, Tucson, AZ (US);
Shawn David Mcdermed, Tucson, AZ (US);
Joanna Schmit, Tucson, AZ (US);
Son Hoang Bui, Tucson, AZ (US);
Matthew Jarrod Novak, Tucson, AZ (US);
Tay-Chang Wu, Tucson, AZ (US);
Jaime Duran, Tucson, AZ (US);
John Christopher Boney, Tucson, AZ (US);
Shawn David McDermed, Tucson, AZ (US);
Joanna Schmit, Tucson, AZ (US);
Son Hoang Bui, Tucson, AZ (US);
Matthew Jarrod Novak, Tucson, AZ (US);
Other;
Abstract
A coordinate measuring machine is calibrated by taking optical measurements of an optical flat that includes a grating placed on its surface. The arm of the CMM capable of multi-directional translation in relation to an object is fitted with a white-light interferometric objective and optical measurements are taken of the flat while translating the objective (or the flat) in the coordinate direction subject to calibration. The objective may serve also as the probe of the CMM.