Son Hoang Bui

Title: Son Hoang Bui: Innovator in Interferometry and Measurement Technologies

Introduction

Son Hoang Bui is a notable inventor based in Tucson, AZ (US), recognized for his contributions to the field of interferometry and measurement technologies. With a total of 2 patents, Bui has developed innovative solutions that enhance the accuracy and efficiency of measurement processes.

Latest Patents

Bui's latest patents include "Side illumination in interferometry" and "Optical plate for calibration of coordinate measuring machines." The first patent focuses on combining side illumination with scanning interferometry, allowing for a single data-acquisition scan to measure surfaces with varying suitability for interferometric processing. This method improves the visibility of structural features and facilitates the identification of regions of interest. The second patent involves calibrating a coordinate measuring machine (CMM) using optical measurements of an optical flat with a grating on its surface. This innovative approach enhances the precision of measurements taken by the CMM.

Career Highlights

Throughout his career, Son Hoang Bui has worked with various companies, including Bruker Nano GmbH. His expertise in measurement technologies has made significant contributions to the field, showcasing his commitment to innovation and excellence.

Collaborations

Bui has collaborated with talented individuals such as Joanna Schmit and Matthew Jarrod Novak, further enriching his professional experience and expanding his network within the industry.

Conclusion

Son Hoang Bui's innovative patents and career achievements highlight his significant impact on the field of interferometry and measurement technologies. His work continues to inspire advancements in precision measurement techniques.